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Layer Stack Modeling

Multi-layer PCBs are modeled in AP 210 as stacks of stratums, each with specific material, thickness, and purpose properties.

Layer Stackup Concepts

A multi-layer PCB consists of alternating conductive and dielectric layers:

┌──────────────────────────┐
│ Solder Mask (Top)         │  Dielectric
├──────────────────────────┤
│ Layer 1: Signal           │  Conductive (Top Copper)
├──────────────────────────┤
│ Prepreg                   │  Dielectric
├──────────────────────────┤
│ Layer 2: Ground           │  Conductive (Inner 1)
├──────────────────────────┤
│ Core                      │  Dielectric
├──────────────────────────┤
│ Layer 3: Power            │  Conductive (Inner 2)
├──────────────────────────┤
│ Prepreg                   │  Dielectric
├──────────────────────────┤
│ Layer 4: Signal           │  Conductive (Bottom Copper)
├──────────────────────────┤
│ Solder Mask (Bottom)      │  Dielectric
└──────────────────────────┘

Stratum Entities

AP 210 uses the following entities for layer modeling:

  • stratum - A single layer (conductive, dielectric, or resistive)

  • stratum_technology - The type of layer (signal, power, ground, dielectric)

  • stratum_feature - A feature on a specific stratum (trace, pad, via)

  • inter_stratum_feature - A feature spanning multiple layers (via)

Layer Properties

Each stratum carries properties:

  • Material - Copper, FR-4, solder mask, etc.

  • Thickness - Physical thickness of the layer

  • Purpose - Signal, power, ground, dielectric

  • Copper weight - For conductive layers (e.g., 1 oz = 35µm)

Via Modeling

Vias connect layers vertically:

  • Through-hole via - Spans all layers

  • Blind via - Connects an outer layer to an inner layer

  • Buried via - Connects two inner layers

#100 = INTER_STRATUM_FEATURE('via 1', '', #board_shape);
#101 = FEATURE_IN_PANEL('via 1', '', #100, #top_stratum, #bottom_stratum);

Reading Layer Data

To understand the layer stack in an AP 210 file:

  1. Find all stratum entities

  2. Identify their stratum_technology (purpose)

  3. Order them by position in the stack

  4. Extract material and thickness properties

  5. Map traces and features to their respective layers